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SEC-Scanning Electron Microscope:Mini-SEM 4500M

SEC-Scanning Electron Microscope:Mini-SEM 4500M

发布日期:2014-05-29 10:06 信息来源:未知

Best specification ever among table-top Electron Microscope
SNE-4500M is focused on two essentials: powerful performance and user-friendly environment. Even with the table-top configuration, SNE-4500M provides high-quality SEM images with the ease of use. No doubt about strong performance and flexible integration - full stroke control including tilt and rotation, optional EDX system and many other tools for your application. Mini-SEM can easily magnify up to 100,000x with variable (5kV to 30kV) accelerating voltage in seconds. Auto-focus, Auto-brightness and contrast produce an excellent image every time.
Key specifications
Magnification up to 100,000x (Digital zoom 4x)
Variable accelerating voltage from 5kV to 30kV (5steps)
Detector: SE detector / BSE detector (optional)
4-hole variable aperture (200um, 100um, 50um, 30um)
5-axis manipulator including tilt-axis control

  • X,Y-axis: 40mm / R-axis: 360°
  • T-axis : 0 to 45°
  • Z-axis : 0 to 35mm
Dimension: 390mm (W) x 330mm (D) x 560mm (H)
390mm (W) x 310mm (D) x 560mm (H) / Controller
EDX Option Available!
EDS (Energy Dispersive Spectroscope) can be adapted SEC Mini-SEM. With powerful performance of Mini-SEM, it brings a very accurate analysis information including spot analysis, mapping, and so on.

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